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In order to improve the efficiency and level of automatic testing systems in analog circuit fault diagnosis, study and defines an analog circuit testing exchange mechanism for Simulation-based test program set development and data transmission provide information and data formats. By Pspice simulation of the circuit and using wavelet analysis to extract features, by BPN, SVM, AIS for knowledge generation and evaluation and ultimately ATIF file is automatically generated. In the experiment ATIF file will be parsed into the post-processing environment, fault detection performed by the TP and reasoning to verify the validity of the test format.