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There are discontinuities in the parameters of the multi-state test system for naval equipment designed at present, which leads to large errors. In order to solve the above problems, a new multi-state test system for naval equipment was designed based on ATML. The system hardware is composed of processors, drivers, sensors, and monitors. Choosing Kirin 990 series processors can effectively reduce the internal load. HDJ-8 AC drivers are used. Three levels of voltages of 2.7KV, 5.7kw and 10KV are introduced to ensure the power supply of the system and the sensor is an HDU sensor with complete functions. The monitor uses a Snapdragon chip to realize status monitoring based on the wireless communication function. The state component modeling is established in the system software design process, and the software process of the multi-state test system for naval equipment is realized through the analysis of text files, equipment data extraction, and state detection. The experimental results show that the designed multi-state test system for naval equipment based on ATML can effectively improve the intermittency of parameters and reduce the internal errors of the system.