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To address the problem that SRAM FPGAs are prone to single-particle effect in space radiation environment, which may affect the normal operation of on-board equipment or even lead to functional interruptions, a research on the ground irradiation test method of single-particle effect of SRAM FPGAs was conducted, and the single-particle flip effect test method of configuration registers and BRAM was proposed. The single-particle effect test system was designed using the Xilinx industrial-grade Virtex-5 series SRAM FPGA as the test object, and the heavy ion irradiation test was carried out to obtain the single event upset test data of the configuration registers, BRAM and typical user circuits before and after TMR, and the single event latch-up test data of the device. Using the CREME96 model, the upset rate of configuration registers for Virtex-5 XC5VFX130 is estimated to be 6.41×10-7/bit?day and 31.6/device?day.